Rock-Hyun Baek

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 24

Top Topics

Parameter Selection

Experimental Verification

Top Venues

Adv. Intell. Syst.

VLSI Technology and Circuits

Publications

Bohyeon Kang, Jehyun An, Jongseo Park, Giryun Hong, Beomjoo Ham, Jaeseong Pyo, Sung-Min Ahn, Rock-Hyun Baek
FEOL Monolithic Co-Integration of FeFET and CMOS on 8-Inch Wafer Using Laser Spike Annealing With Implementation of an FeFET Inverter. IEEE Access 12 (2024)
Jun Hui Park, Jung Nam Kim, Seonhaeng Lee, Gang-Jun Kim, Namhyun Lee, Rock-Hyun Baek, Dae Hwan Kim, Changhyun Kim, Myounggon Kang, Yoon Kim
Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning. IEEE Access 12 (2024)
Hyunseo You, Kihoon Nam, Jehyun An, Chanyang Park, Donghyun Kim, Seonhaeng Lee, Namhyun Lee, Rock-Hyun Baek
Cryogenic Body Bias Effect in DRAM Peripheral and Buried-Channel-Array Transistor for Quantum Computing Applications. IEEE Access 12 (2024)
Seungjoon Eom, Hyeok Yun, Hyundong Jang, Kyeongrae Cho, Seunghwan Lee, Jinsu Jeong, Rock-Hyun Baek
Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation. Adv. Intell. Syst. 6 (4) (2024)
Kihoon Nam, Chanyang Park, Hyeok Yun, Jun-Sik Yoon, Hyundong Jang, Kyeongrae Cho, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek
Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning. IEEE Access 11 (2023)
Jongseo Park, Kyeong-Keun Choi, Jehyun An, Bohyeon Kang, Hyeonseo You, Giryun Hong, Sung-Min Ahn, Rock-Hyun Baek
Curing Process on Passivation Layer for Backside-Illuminated CMOS Image Sensor Application. IEEE Access 11 (2023)
J. Lee, J. Jeong, S. Lee, S. Lee, J. Lim, S. C. Song, S. Ekbote, N. Stevens-Yu, D. Greenlaw, Rock-Hyun Baek
Front-side and Back-side Power Delivery Network Guidelines for 2nm node High Perf Computing and Mobile SoC applications. VLSI Technology and Circuits (2023)
Kyeongrae Cho, Jeong-Sik Lee, Chanyang Park, Hyeok Yun, Hyundong Jang, Seungjoon Eom, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek
Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application. Adv. Intell. Syst. 5 (12) (2023)
Hyeok Yun, Chang-Hyeon An, Hyundong Jang, Kyeongrae Cho, Jeong-Sik Lee, Seungjoon Eom, Choong-Ki Kim, Min-Soo Yoo, Hyun-Chul Choi, Rock-Hyun Baek
Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. Adv. Intell. Syst. 5 (9) (2023)
Jeong-Sik Lee, Rock-Hyun Baek, Hyun-Chul Choi
Arbitrary Font Generation by Encoder Learning of Disentangled Features. Sensors 22 (6) (2022)
Hyundong Jang, Hyeok Yun, Chanyang Park, Kyeongrae Cho, Kihoon Nam, Jun-Sik Yoon, Hyun-Chul Choi, Rock-Hyun Baek
Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm. IEEE Access 10 (2022)
Ubaid Ullah, Jeong-Sik Lee, Chang-Hyeon An, Hyeonjin Lee, Su-Yeong Park, Rock-Hyun Baek, Hyun-Chul Choi
A Review of Multi-Modal Learning from the Text-Guided Visual Processing Viewpoint. Sensors 22 (18) (2022)
Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Junjong Lee, Sanguk Lee, Jaewan Lim, Rock-Hyun Baek
DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors. IEEE Access 10 (2022)
Junjong Lee, Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Sanguk Lee, Rock-Hyun Baek
Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes. IEEE Access 9 (2021)
Jinsu Jeong, Jun-Sik Yoon, Rock-Hyun Baek
Analysis of TSV-Induced Mechanical Stress and Electrical Noise Coupling in Sub 5-nm Node Nanosheet FETs for Heterogeneous 3D-ICs. IEEE Access 9 (2021)
Jun-Sik Yoon, Seunghwan Lee, Hyeok Yun, Rock-Hyun Baek
Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning. IEEE Access 9 (2021)
Jinsu Jeong, Jun-Sik Yoon, Seunghwan Lee, Rock-Hyun Baek
Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application. IEEE Access 8 (2020)
Jun-Sik Yoon, Rock-Hyun Baek
Device Design Guideline of 5-nm-Node FinFETs and Nanosheet FETs for Analog/RF Applications. IEEE Access 8 (2020)
Hyun-Chul Choi, Hyeok Yun, Jun-Sik Yoon, Rock-Hyun Baek
Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing. IEEE Access 8 (2020)
Jun-Sik Yoon, Rock-Hyun Baek
A Novel Sub-5-nm Node Dual-Workfunction Folded Cascode Nanosheet FETs for Low Power Mobile Applications. IEEE Access 8 (2020)
Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Rock-Hyun Baek
Bottom Oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node. IEEE Access 7 (2019)
Jun-Sik Yoon, Seunghwan Lee, Junjong Lee, Jinsu Jeong, Hyeok Yun, Bohyeon Kang, Rock-Hyun Baek
Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node. IEEE Access 7 (2019)
Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Rock-Hyun Baek
Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain. IEEE Access 7 (2019)
Kyunghyun Lim, Minsoo Choi, Myat Thu Linn Aung, Kyunghwan Kim, Ji-Seong Kim, Rock-Hyun Baek, Ho-Jin Song, Tony Tae-Hyoung Kim, Byungsub Kim
Experimental Verification of a Simple, Intuitive, and Accurate Closed-Form Transfer Function Model for Diverse High-Speed Interconnects. ISOCC (2018)