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Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning.

Kihoon NamChanyang ParkHyeok YunJun-Sik YoonHyundong JangKyeongrae ChoMin Sang ParkHyun-Chul ChoiRock-Hyun Baek
Published in: IEEE Access (2023)
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