Jun-Sik Yoon

Publication Activity (10 Years)

Years Active: 2019-2023
Publications (10 Years): 14

Top Topics

Schottky Barrier

Comprehensive Analysis

Top Venues

Publications

Kihoon Nam, Chanyang Park, Hyeok Yun, Jun-Sik Yoon, Hyundong Jang, Kyeongrae Cho, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek
Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning. IEEE Access 11 (2023)
Sandra Maria Shaji, Lingjun Zhu, Jun-Sik Yoon, Sung Kyu Lim
A Comparative Study on Front-Side, Buried and Back-Side Power Rail Topologies in 3nm Technology Node. ISLPED (2023)
Hyundong Jang, Hyeok Yun, Chanyang Park, Kyeongrae Cho, Kihoon Nam, Jun-Sik Yoon, Hyun-Chul Choi, Rock-Hyun Baek
Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm. IEEE Access 10 (2022)
Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Junjong Lee, Sanguk Lee, Jaewan Lim, Rock-Hyun Baek
DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors. IEEE Access 10 (2022)
Junjong Lee, Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Sanguk Lee, Rock-Hyun Baek
Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes. IEEE Access 9 (2021)
Jinsu Jeong, Jun-Sik Yoon, Rock-Hyun Baek
Analysis of TSV-Induced Mechanical Stress and Electrical Noise Coupling in Sub 5-nm Node Nanosheet FETs for Heterogeneous 3D-ICs. IEEE Access 9 (2021)
Jun-Sik Yoon, Seunghwan Lee, Hyeok Yun, Rock-Hyun Baek
Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning. IEEE Access 9 (2021)
Jinsu Jeong, Jun-Sik Yoon, Seunghwan Lee, Rock-Hyun Baek
Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application. IEEE Access 8 (2020)
Jun-Sik Yoon, Rock-Hyun Baek
Device Design Guideline of 5-nm-Node FinFETs and Nanosheet FETs for Analog/RF Applications. IEEE Access 8 (2020)
Hyun-Chul Choi, Hyeok Yun, Jun-Sik Yoon, Rock-Hyun Baek
Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing. IEEE Access 8 (2020)
Jun-Sik Yoon, Rock-Hyun Baek
A Novel Sub-5-nm Node Dual-Workfunction Folded Cascode Nanosheet FETs for Low Power Mobile Applications. IEEE Access 8 (2020)
Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Rock-Hyun Baek
Bottom Oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node. IEEE Access 7 (2019)
Jun-Sik Yoon, Seunghwan Lee, Junjong Lee, Jinsu Jeong, Hyeok Yun, Bohyeon Kang, Rock-Hyun Baek
Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node. IEEE Access 7 (2019)
Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Rock-Hyun Baek
Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain. IEEE Access 7 (2019)