Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm.
Hyundong JangHyeok YunChanyang ParkKyeongrae ChoKihoon NamJun-Sik YoonHyun-Chul ChoiRock-Hyun BaekPublished in: IEEE Access (2022)
Keyphrases
- neural network
- learning algorithm
- detection algorithm
- expectation maximization
- artificial neural networks
- auto associative
- bp algorithm
- np hard
- cost function
- k means
- search space
- optimal parameters
- parameter tuning
- preprocessing
- computational complexity
- linear programming
- input data
- optimization algorithm
- convergence rate
- dc programming
- multilayer perceptron
- matching algorithm
- self organizing maps
- segmentation algorithm
- particle swarm optimization
- maximum likelihood
- simulated annealing
- dynamic programming
- lower bound