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Hyeok Yun
ORCID
Publication Activity (10 Years)
Years Active: 2019-2024
Publications (10 Years): 8
Top Topics
Neural Network
Parameter Selection
Modeling Framework
High Accuracy
Top Venues
IEEE Access
Adv. Intell. Syst.
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Publications
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Seungjoon Eom
,
Hyeok Yun
,
Hyundong Jang
,
Kyeongrae Cho
,
Seunghwan Lee
,
Jinsu Jeong
,
Rock-Hyun Baek
Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation.
Adv. Intell. Syst.
6 (4) (2024)
Kihoon Nam
,
Chanyang Park
,
Hyeok Yun
,
Jun-Sik Yoon
,
Hyundong Jang
,
Kyeongrae Cho
,
Min Sang Park
,
Hyun-Chul Choi
,
Rock-Hyun Baek
Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning.
IEEE Access
11 (2023)
Kyeongrae Cho
,
Jeong-Sik Lee
,
Chanyang Park
,
Hyeok Yun
,
Hyundong Jang
,
Seungjoon Eom
,
Min Sang Park
,
Hyun-Chul Choi
,
Rock-Hyun Baek
Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application.
Adv. Intell. Syst.
5 (12) (2023)
Hyeok Yun
,
Chang-Hyeon An
,
Hyundong Jang
,
Kyeongrae Cho
,
Jeong-Sik Lee
,
Seungjoon Eom
,
Choong-Ki Kim
,
Min-Soo Yoo
,
Hyun-Chul Choi
,
Rock-Hyun Baek
Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development.
Adv. Intell. Syst.
5 (9) (2023)
Hyundong Jang
,
Hyeok Yun
,
Chanyang Park
,
Kyeongrae Cho
,
Kihoon Nam
,
Jun-Sik Yoon
,
Hyun-Chul Choi
,
Rock-Hyun Baek
Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm.
IEEE Access
10 (2022)
Jun-Sik Yoon
,
Seunghwan Lee
,
Hyeok Yun
,
Rock-Hyun Baek
Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning.
IEEE Access
9 (2021)
Hyun-Chul Choi
,
Hyeok Yun
,
Jun-Sik Yoon
,
Rock-Hyun Baek
Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing.
IEEE Access
8 (2020)
Jun-Sik Yoon
,
Seunghwan Lee
,
Junjong Lee
,
Jinsu Jeong
,
Hyeok Yun
,
Bohyeon Kang
,
Rock-Hyun Baek
Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node.
IEEE Access
7 (2019)