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Analysis of TSV-Induced Mechanical Stress and Electrical Noise Coupling in Sub 5-nm Node Nanosheet FETs for Heterogeneous 3D-ICs.
Jinsu Jeong
Jun-Sik Yoon
Rock-Hyun Baek
Published in:
IEEE Access (2021)
Keyphrases
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neural network
case study
data analysis
real time
data sets
learning algorithm
color images
statistical analysis