Mitsuhiko Igarashi

Publication Activity (10 Years)

Years Active: 2012-2023
Publications (10 Years): 6

Top Topics

Clock Frequency

Cmos Technology

Dynamic Random Access Memory

Top Venues

Publications

Kazutoshi Kobayashi, Tomoharu Kishita, Hiroki Nakano, Jun Furuta, Mitsuhiko Igarashi, Shigetaka Kumashiro, Michitarou Yabuuchi, Hironori Sakamoto
Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring Oscillators. IRPS (2023)
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani, Kazutoshi Kobayashi
An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (11) (2021)
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani
Study of Local BTI Variation and its Impact on Logic Circuit and SRAM in 7 nm Fin-FET Process. IRPS (2019)
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii
A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process. A-SSCC (2018)
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii
Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET. IRPS (2018)
Mitsuhiko Igarashi, Yoshio Takazawa, Yasumasa Tsukamoto, Kan Takeuchi, Koji Shibutani
NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator. A-SSCC (2017)
Mitsuhiko Igarashi, Toshifumi Uemura, Ryo Mori, Hiroshi Kishibe, Midori Nagayama, Masaaki Taniguchi, Kohei Wakahara, Toshiharu Saito, Masaki Fujigaya, Kazuki Fukuoka, Koji Nii, Takeshi Kataoka, Toshihiro Hattori
A 28 nm High-k/MG Heterogeneous Multi-Core Mobile Application Processor With 2 GHz Cores and Low-Power 1 GHz Cores. IEEE J. Solid State Circuits 50 (1) (2015)
Mitsuhiko Igarashi, Kan Takeuchi, Takeshi Okagaki, Koji Shibutani, Hiroaki Matsushita, Koji Nii
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology. ESSCIRC (2015)
Mitsuhiko Igarashi, Hideki Aono, Hideaki Abe, Koji Shibutani, Kan Takeuchi
Assessment of reliability impact on GHz processors with moderate overdrive. ISQED (2014)
Mitsuhiko Igarashi, Toshifumi Uemura, Ryo Mori, Noriaki Maeda, Hiroshi Kishibe, Midori Nagayama, Masaaki Taniguchi, Kohei Wakahara, Toshiharu Saito, Masaki Fujigaya, Kazuki Fukuoka, Koji Nii, Takeshi Kataoka, Toshihiro Hattori
10.2 A 28nm HPM heterogeneous multi-core mobile application processor with 2GHz cores and low-power 1GHz cores. ISSCC (2014)
Mitsuhiko Igarashi, Kan Takeuchi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization. CICC (2012)