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Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring Oscillators.

Kazutoshi KobayashiTomoharu KishitaHiroki NakanoJun FurutaMitsuhiko IgarashiShigetaka KumashiroMichitarou YabuuchiHironori Sakamoto
Published in: IRPS (2023)
Keyphrases
  • long term
  • short term
  • high speed
  • communication systems
  • medium term
  • data acquisition
  • measurement model
  • age related
  • database
  • age estimation