MEASUREMENT MODEL
Experts
- Joseph Y. Halpern
- Darshana Sedera
- Yong Yan
- Thomas Eiter
- Lijuan Wang
- Judea Pearl
- Guy G. Gable
- Thomas Lukasiewicz
- Trevor Burbridge
- Olga Ormandjieva
- Tom Heskes
- Sen-Tarng Lai
- Alain Abran
- Param Vir Singh
- Philip Eardley
- Hans Knoop
- Perry Groot
- Marianne Heins
- Ridho Rahmadi
- Yan Huang
- Steve McKeever
- Xin-Ji Liu
- Oleg Sergiyenko
- William J. Doll
- P. M. Nabeel
- Hana Chockler
- Markus Rupp
- Khalid T. Al-Sarayreh
- Daniel J. McDuff
- Shu-Tao Xia
- Ali Tarhini
- Luigi Lavazza
- Glenn Lowry
- Daniel Hernandez Balbuena
- Christian Schlegel
- Rodney Turner
- Matthew J. Daigle
- Hepu Deng
- Anindya Ghose
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- I2MTC
- IGARSS
- ICIS
- EMBC
- BMC Medical Informatics Decis. Mak.
- IEEE Trans. Biomed. Eng.
- Remote. Sens.
- AMCIS
- PACIS
- Expert Syst. Appl.
- Quantum Inf. Process.
- Entropy
- MeMeA
- HICSS
- NeuroImage
- CDC
- Comput. Hum. Behav.
- Int. J. Medical Informatics
- MIS Q.
- Educ. Inf. Technol.
- AMPS
- Cyberpsychology Behav. Soc. Netw.
- Comput. Educ.
- Eur. J. Oper. Res.
- IEEE Instrum. Meas. Mag.
- Data Base
- ITC
- IECON
- Manag. Sci.
- IEEE Trans. Ind. Electron.
- Int. J. Distributed Sens. Networks
- Inf. Sci.
- Symmetry
- IEICE Trans. Electron.
- Scientometrics
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