MEASUREMENT MODEL
Experts
- Joseph Y. Halpern
- Darshana Sedera
- Yong Yan
- Guy G. Gable
- Judea Pearl
- Thomas Lukasiewicz
- Lijuan Wang
- Thomas Eiter
- Marianne Heins
- Perry Groot
- Alain Abran
- Trevor Burbridge
- Steve McKeever
- Philip Eardley
- Yan Huang
- Olga Ormandjieva
- Param Vir Singh
- Tom Heskes
- Hans Knoop
- Ridho Rahmadi
- Sen-Tarng Lai
- Indranil Roychoudhury
- Hana Chockler
- Aníbal Bregón
- Ali Tarhini
- Oleg Sergiyenko
- Daniel J. McDuff
- Jayaraj Joseph
- Hepu Deng
- Glenn Lowry
- Markus Rupp
- Alexei Manso Corrêa Machado
- Jie Zhang
- Yogi Tri Prasetyo
- Timothy Teo
- Fang-Yie Leu
- Anindya Ghose
- Daniel Hernandez Balbuena
- Matthew J. Daigle
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- I2MTC
- IGARSS
- ICIS
- EMBC
- BMC Medical Informatics Decis. Mak.
- IEEE Trans. Biomed. Eng.
- Remote. Sens.
- Entropy
- PACIS
- AMCIS
- Expert Syst. Appl.
- MeMeA
- Quantum Inf. Process.
- CDC
- HICSS
- Comput. Hum. Behav.
- NeuroImage
- Educ. Inf. Technol.
- Int. J. Medical Informatics
- AMPS
- IEEE Trans. Ind. Electron.
- MIS Q.
- ITC
- Manag. Sci.
- Cyberpsychology Behav. Soc. Netw.
- Eur. J. Oper. Res.
- IEEE Instrum. Meas. Mag.
- IECON
- Inf. Sci.
- Comput. Educ.
- Data Base
- SMC
- IAS
- Int. J. Distributed Sens. Networks
- ACC
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