MEASUREMENT MODEL
Experts
- Joseph Y. Halpern
- Darshana Sedera
- Yong Yan
- Judea Pearl
- Thomas Lukasiewicz
- Thomas Eiter
- Lijuan Wang
- Guy G. Gable
- Marianne Heins
- Alain Abran
- Steve McKeever
- Philip Eardley
- Olga Ormandjieva
- Param Vir Singh
- Yan Huang
- Tom Heskes
- Ridho Rahmadi
- Hans Knoop
- Perry Groot
- Sen-Tarng Lai
- Trevor Burbridge
- Xin-Ji Liu
- Markus Rupp
- Oleg Sergiyenko
- V. Jagadeesh Kumar
- Jayaraj Joseph
- Fang-Yie Leu
- Jun Zhang
- Anindya Ghose
- William J. Doll
- Christian Schlegel
- Khalid T. Al-Sarayreh
- Indranil Roychoudhury
- Luigi Lavazza
- Daniel J. McDuff
- Hepu Deng
- Taizan Chan
- Julie Fisher
- Mohanasankar Sivaprakasam
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- I2MTC
- IGARSS
- ICIS
- EMBC
- BMC Medical Informatics Decis. Mak.
- IEEE Trans. Biomed. Eng.
- PACIS
- AMCIS
- Entropy
- Remote. Sens.
- Expert Syst. Appl.
- MeMeA
- Quantum Inf. Process.
- NeuroImage
- Comput. Hum. Behav.
- CDC
- HICSS
- AMPS
- MIS Q.
- IEEE Trans. Ind. Electron.
- Educ. Inf. Technol.
- Int. J. Medical Informatics
- Comput. Educ.
- IECON
- Data Base
- ITC
- Eur. J. Oper. Res.
- Cyberpsychology Behav. Soc. Netw.
- Manag. Sci.
- IEEE Instrum. Meas. Mag.
- Inf. Sci.
- ICASSP
- IAS
- OFC
- GLOBECOM
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