MEASUREMENT MODEL
Experts
- Joseph Y. Halpern
- Darshana Sedera
- Yong Yan
- Guy G. Gable
- Thomas Lukasiewicz
- Thomas Eiter
- Lijuan Wang
- Judea Pearl
- Tom Heskes
- Yan Huang
- Hans Knoop
- Sen-Tarng Lai
- Alain Abran
- Olga Ormandjieva
- Trevor Burbridge
- Ridho Rahmadi
- Marianne Heins
- Steve McKeever
- Perry Groot
- Param Vir Singh
- Philip Eardley
- Xin-Ji Liu
- Indranil Roychoudhury
- Yogi Tri Prasetyo
- Alexei Manso Corrêa Machado
- Daniel Hernandez Balbuena
- Hana Chockler
- William J. Doll
- Hepu Deng
- Anindya Ghose
- Rodney Turner
- Jayaraj Joseph
- Daniel J. McDuff
- Timothy Teo
- Jie Zhang
- Khalid T. Al-Sarayreh
- Taizan Chan
- Mohanasankar Sivaprakasam
- Jun Zhang
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- I2MTC
- IGARSS
- ICIS
- EMBC
- BMC Medical Informatics Decis. Mak.
- IEEE Trans. Biomed. Eng.
- PACIS
- Remote. Sens.
- AMCIS
- Entropy
- MeMeA
- Expert Syst. Appl.
- Quantum Inf. Process.
- HICSS
- Comput. Hum. Behav.
- NeuroImage
- CDC
- AMPS
- Int. J. Medical Informatics
- IEEE Trans. Ind. Electron.
- MIS Q.
- Educ. Inf. Technol.
- ITC
- Manag. Sci.
- Data Base
- Comput. Educ.
- IECON
- Cyberpsychology Behav. Soc. Netw.
- IEEE Instrum. Meas. Mag.
- Inf. Sci.
- Eur. J. Oper. Res.
- GLOBECOM
- Int. J. Hum. Comput. Interact.
- ICRA
- Comput. Stat. Data Anal.
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