MEASUREMENT MODEL
Experts
- Joseph Y. Halpern
- Yong Yan
- Darshana Sedera
- Judea Pearl
- Lijuan Wang
- Thomas Eiter
- Guy G. Gable
- Thomas Lukasiewicz
- Param Vir Singh
- Philip Eardley
- Alain Abran
- Olga Ormandjieva
- Trevor Burbridge
- Ridho Rahmadi
- Marianne Heins
- Perry Groot
- Steve McKeever
- Sen-Tarng Lai
- Tom Heskes
- Yan Huang
- Hans Knoop
- Luigi Lavazza
- AnÃbal Bregón
- David Gefen
- Ali Tarhini
- Shu-Tao Xia
- Fang-Yie Leu
- Marcelo Bagnulo
- Fumihito Arai
- Glenn Lowry
- Julie Fisher
- Christian Schlegel
- Markus Rupp
- V. Jagadeesh Kumar
- P. M. Nabeel
- Matthew J. Daigle
- Oleg Sergiyenko
- Jayaraj Joseph
- Daniel J. McDuff
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- I2MTC
- IGARSS
- ICIS
- EMBC
- BMC Medical Informatics Decis. Mak.
- IEEE Trans. Biomed. Eng.
- Remote. Sens.
- PACIS
- Entropy
- AMCIS
- Quantum Inf. Process.
- Expert Syst. Appl.
- MeMeA
- HICSS
- NeuroImage
- CDC
- Comput. Hum. Behav.
- IEEE Trans. Ind. Electron.
- Int. J. Medical Informatics
- AMPS
- MIS Q.
- Educ. Inf. Technol.
- Data Base
- Cyberpsychology Behav. Soc. Netw.
- Comput. Educ.
- IECON
- ITC
- Manag. Sci.
- Eur. J. Oper. Res.
- IEEE Instrum. Meas. Mag.
- Inf. Sci.
- Int. J. Distributed Sens. Networks
- ACC
- Comput. Stat. Data Anal.
- Int. J. Hum. Comput. Interact.
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