MEASUREMENT MODEL
Experts
- Joseph Y. Halpern
- Yong Yan
- Darshana Sedera
- Thomas Eiter
- Lijuan Wang
- Thomas Lukasiewicz
- Guy G. Gable
- Judea Pearl
- Philip Eardley
- Steve McKeever
- Trevor Burbridge
- Perry Groot
- Alain Abran
- Marianne Heins
- Ridho Rahmadi
- Sen-Tarng Lai
- Tom Heskes
- Hans Knoop
- Olga Ormandjieva
- Param Vir Singh
- Yan Huang
- Matthew J. Daigle
- Shu-Tao Xia
- Luigi Lavazza
- Anindya Ghose
- Fang-Yie Leu
- Daniel Hernandez Balbuena
- Jie Zhang
- Yogi Tri Prasetyo
- Timothy Teo
- Hepu Deng
- Glenn Lowry
- Markus Rupp
- Alexei Manso Corrêa Machado
- Ali Tarhini
- Daniel J. McDuff
- Oleg Sergiyenko
- Jayaraj Joseph
- Indranil Roychoudhury
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- I2MTC
- IGARSS
- ICIS
- EMBC
- BMC Medical Informatics Decis. Mak.
- IEEE Trans. Biomed. Eng.
- PACIS
- AMCIS
- Remote. Sens.
- Entropy
- Quantum Inf. Process.
- Expert Syst. Appl.
- MeMeA
- NeuroImage
- CDC
- HICSS
- Comput. Hum. Behav.
- IEEE Trans. Ind. Electron.
- MIS Q.
- Educ. Inf. Technol.
- Int. J. Medical Informatics
- AMPS
- Inf. Sci.
- Comput. Educ.
- Data Base
- ITC
- Manag. Sci.
- Cyberpsychology Behav. Soc. Netw.
- Eur. J. Oper. Res.
- IEEE Instrum. Meas. Mag.
- IECON
- Int. J. Hum. Comput. Interact.
- Comput. Stat. Data Anal.
- GLOBECOM
- Symmetry
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend