MEASUREMENT MODEL
Experts
- Joseph Y. Halpern
- Yong Yan
- Darshana Sedera
- Guy G. Gable
- Lijuan Wang
- Thomas Eiter
- Thomas Lukasiewicz
- Judea Pearl
- Tom Heskes
- Yan Huang
- Ridho Rahmadi
- Perry Groot
- Hans Knoop
- Trevor Burbridge
- Sen-Tarng Lai
- Param Vir Singh
- Olga Ormandjieva
- Philip Eardley
- Marianne Heins
- Steve McKeever
- Alain Abran
- Alexei Manso Corrêa Machado
- Daniel Hernandez Balbuena
- Fumihito Arai
- David Gefen
- Rodney Turner
- Matthew J. Daigle
- Marcelo Bagnulo
- Timothy Teo
- Yogi Tri Prasetyo
- Ali Tarhini
- Shu-Tao Xia
- P. M. Nabeel
- Hepu Deng
- Luigi Lavazza
- Daniel J. McDuff
- Indranil Roychoudhury
- Jie Zhang
- Mohanasankar Sivaprakasam
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- I2MTC
- IGARSS
- ICIS
- EMBC
- BMC Medical Informatics Decis. Mak.
- IEEE Trans. Biomed. Eng.
- PACIS
- AMCIS
- Remote. Sens.
- Entropy
- Quantum Inf. Process.
- Expert Syst. Appl.
- MeMeA
- CDC
- HICSS
- NeuroImage
- Comput. Hum. Behav.
- Int. J. Medical Informatics
- IEEE Trans. Ind. Electron.
- Educ. Inf. Technol.
- MIS Q.
- AMPS
- Inf. Sci.
- IEEE Instrum. Meas. Mag.
- Manag. Sci.
- ITC
- Comput. Educ.
- IECON
- Data Base
- Cyberpsychology Behav. Soc. Netw.
- Eur. J. Oper. Res.
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Stat. Data Anal.
- SMC
- ICRA
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