Michitarou Yabuuchi

Publication Activity (10 Years)

Years Active: 2010-2023
Publications (10 Years): 4

Top Topics

Simulation Environment

Top Venues

IEICE Trans. Fundam. Electron. Commun. Comput. Sci.

IPSJ Trans. Syst. LSI Des. Methodol.

Publications

Kazutoshi Kobayashi, Tomoharu Kishita, Hiroki Nakano, Jun Furuta, Mitsuhiko Igarashi, Shigetaka Kumashiro, Michitarou Yabuuchi, Hironori Sakamoto
Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring Oscillators. IRPS (2023)
Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi
Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMS. ICICDT (2017)
Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi
Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2017)
Michitarou Yabuuchi, Kazutoshi Kobayashi
Size Optimization Technique for Logic Circuits that Considers BTI and Process Variations. IPSJ Trans. Syst. LSI Des. Methodol. 9 (2016)
Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi
Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2014)
Michitarou Yabuuchi, Kazutoshi Kobayashi
NBTI-Induced Delay Degradation Analysis of FPGA Routing Structures. Inf. Media Technol. 7 (4) (2012)
Michitarou Yabuuchi, Kazutoshi Kobayashi
NBTI-Induced Delay Degradation Analysis of FPGA Routing Structures. IPSJ Trans. Syst. LSI Des. Methodol. 5 (2012)
Michitarou Yabuuchi, Kazutoshi Kobayashi
Evaluation of FPGA design guardband caused by inhomogeneous NBTI degradation considering process variations. FPT (2010)