Ryo Kishida

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 14

Top Topics

Primate Visual Cortex

Scanning Electron Microscope

Electric Arc Furnace

Top Venues

IEICE Trans. Fundam. Electron. Commun. Comput. Sci.

Publications

Reo Nagasue, Isamu Mizuno, Ryo Kishida, Tatsuya Iwata, Takefumi Yoshikawa
A Fractional-N PLL for Multi-phase Clock Generation with Loop Bandwidth Enhancement. ISCAS (2024)
Daisuke Kikuta, Ryo Kishida, Kazutoshi Kobayashi
Ring Oscillators with identical Circuit Structure to Measure Bias Temperature Instability. ASICON (2023)
Ikuo Suda, Ryo Kishida, Kazutoshi Kobayashi
An Aging Degradation Suppression Scheme at Constant Performance by Controlling Supply Voltage and Body Bias in a 65 nm Fully-Depleted Silicon-On-Insulator Process. IRPS (2022)
Satoshi Sekine, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
Digital Calibration Algorithm of Conversion Error Influenced by Parasitic Capacitance in C-C SAR-ADC Based on γ-Estimation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2) (2021)
Ryo Kishida, Ikuo Suda, Kazutoshi Kobayashi
Bias Temperature Instability Depending on Body Bias through Buried Oxide (BOX) Layer in a 65 nm Fully-Depleted Silicon-On-Insulator Process. IRPS (2021)
Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi
Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement. IPSJ Trans. Syst. LSI Des. Methodol. 13 (2020)
Takuya Asuke, Ryo Kishida, Jun Furuta, Kazutoshi Kobayashi
Temperature Dependence of Bias Temperature Instability (BTI) in Long-term Measurement by BTI-sensitive and -insensitive Ring Oscillators Removing Environmental Fluctuation. ASICON (2019)
Yuichiro Unno, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
Examination of Incremental ADC with SAR ADC to Reduce Conversion Time with High Accuracy. ISPACS (2019)
Yuki Tanaka, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
Duty Ratio and Capacitance Analysis of AC/DC Converter without Current Control Circuit. ISPACS (2019)
Yuichiro Kobayashi, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
Investigation of Hybrid ADC Combined with First-order Feedforward Incremental and SAR ADCs. ISPACS (2019)
Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi
Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. IOLTS (2019)
Satoshi Sekine, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo
A Novel C-2αC Ladder Based Non-binary DAC for SAR-ADC Using Unit Capacitors. ISPACS (2018)
Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi
Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMS. ICICDT (2017)
Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi
Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2017)
Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi
Negative bias temperature instability caused by plasma induced damage in 65 nm bulk and Silicon on thin BOX (SOTB) processes. IRPS (2015)
Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi
Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2014)