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Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement.
Takumi Hosaka
Shinichi Nishizawa
Ryo Kishida
Takashi Matsumoto
Kazutoshi Kobayashi
Published in:
IPSJ Trans. Syst. LSI Des. Methodol. (2020)
Keyphrases
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long term
face recognition
computational complexity
viewpoint
post processing