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Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement.

Takumi HosakaShinichi NishizawaRyo KishidaTakashi MatsumotoKazutoshi Kobayashi
Published in: IOLTS (2019)
Keyphrases
  • long term
  • single shot
  • short term
  • image analysis
  • image processing
  • structured light