Koji Shibutani

Publication Activity (10 Years)

Years Active: 2012-2021
Publications (10 Years): 8

Top Topics

Variance Estimator

Positive Effects

Top Venues

Publications

Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani, Kazutoshi Kobayashi
An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (11) (2021)
Kan Takeuchi, Masaki Shimada, Shinya Konishi, Daisuke Oshida, Naoya Ota, Takashi Yasumasu, Koji Shibutani, Tomohiro Iwashita, Tetsuya Kokubun, Fumio Tsuchiya
Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance. IRPS (2019)
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani
Study of Local BTI Variation and its Impact on Logic Circuit and SRAM in 7 nm Fin-FET Process. IRPS (2019)
Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya
Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. IET Circuits Devices Syst. 12 (2) (2018)
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii
A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process. A-SSCC (2018)
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii
Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET. IRPS (2018)
Mitsuhiko Igarashi, Yoshio Takazawa, Yasumasa Tsukamoto, Kan Takeuchi, Koji Shibutani
NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator. A-SSCC (2017)
Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya
FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. ESSCIRC (2016)
Mitsuhiko Igarashi, Kan Takeuchi, Takeshi Okagaki, Koji Shibutani, Hiroaki Matsushita, Koji Nii
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology. ESSCIRC (2015)
Mitsuhiko Igarashi, Hideki Aono, Hideaki Abe, Koji Shibutani, Kan Takeuchi
Assessment of reliability impact on GHz processors with moderate overdrive. ISQED (2014)
Kazuki Fukuoka, Ryo Mori, A. Kato, Motoshige Igarashi, Koji Shibutani, T. Yamaki, Shinji Tanaka, Koji Nii, Sadayuki Morita, Takao Koike, Noriaki Sakamoto
A 123μW standby power technique with EM-tolerant 1.8V I/O NMOS power switch in 28nm HKMG technology. CICC (2012)