Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance.
Kan TakeuchiMasaki ShimadaShinya KonishiDaisuke OshidaNaoya OtaTakashi YasumasuKoji ShibutaniTomohiro IwashitaTetsuya KokubunFumio TsuchiyaPublished in: IRPS (2019)