Kan Takeuchi

Publication Activity (10 Years)

Years Active: 2004-2019
Publications (10 Years): 4

Top Topics

Cmos Technology

Spatial Distribution

Top Venues

Publications

Kan Takeuchi, Masaki Shimada, Shinya Konishi, Daisuke Oshida, Naoya Ota, Takashi Yasumasu, Koji Shibutani, Tomohiro Iwashita, Tetsuya Kokubun, Fumio Tsuchiya
Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance. IRPS (2019)
Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya
Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. IET Circuits Devices Syst. 12 (2) (2018)
Mitsuhiko Igarashi, Yoshio Takazawa, Yasumasa Tsukamoto, Kan Takeuchi, Koji Shibutani
NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator. A-SSCC (2017)
Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya
FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. ESSCIRC (2016)
Mitsuhiko Igarashi, Kan Takeuchi, Takeshi Okagaki, Koji Shibutani, Hiroaki Matsushita, Koji Nii
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology. ESSCIRC (2015)
Mitsuhiko Igarashi, Hideki Aono, Hideaki Abe, Koji Shibutani, Kan Takeuchi
Assessment of reliability impact on GHz processors with moderate overdrive. ISQED (2014)
Kan Takeuchi, Masaki Shimada, Takao Sato, Yusaku Katsuki, Hiroumi Yoshikawa, Hiroaki Matsushita
Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise. IEEE Trans. Very Large Scale Integr. Syst. 21 (1) (2013)
Mitsuhiko Igarashi, Kan Takeuchi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization. CICC (2012)
Kan Takeuchi
Non-parametric test of time consistency: Present bias and future bias. Games Econ. Behav. 71 (2) (2011)
Yan Chen, Kan Takeuchi
Multi-object auctions with package bidding: An experimental comparison of Vickrey and iBEA. Games Econ. Behav. 68 (2) (2010)
Kan Takeuchi, Atsushi Yoshikawa, Michio Komoda, Ken Kotani, Hiroaki Matsushita, Yusaku Katsuki, YuyoYamamoto, Takao Sato
Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. IEEE Trans. Very Large Scale Integr. Syst. 16 (11) (2008)
Genichi Tanaka, Kan Takeuchi, Minoru Ito, Hiroaki Matsushita
A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process. CICC (2008)
Kan Takeuchi, Genichi Tanaka, Hiroaki Matsushita, Kenichi Yoshizumi, Yusaku Katsuki, Takao Sato
Observations of Supply-Voltage-Noise Dispersion in Sub-nsec. ITC (2008)
Kan Takeuchi, John Lin, Yan Chen, Thomas A. Finholt
Shake it up baby: scheduling with package auctions. EC (2007)
Xiuqin Chen, Shaoming Yang, M. Hasegawa, Kan Takeuchi, K. Kawabe, Seiji Motojima
Novel Tactile Sensors Manufactured by Carbon Microcoils. ICMENS (2004)
Kan Takeuchi, Kazumasa Yanagisawa, Takashi Sato, Kazuko Sakamoto, Saburo Hojo
Probabilistic crosstalk delay estimation for ASICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23 (9) (2004)