Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations.
Kan TakeuchiAtsushi YoshikawaMichio KomodaKen KotaniHiroaki MatsushitaYusaku Katsuki YuyoYamamotoTakao SatoPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2008)