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Takeshi Okagaki
Publication Activity (10 Years)
Years Active: 2015-2018
Publications (10 Years): 2
Top Topics
Cmos Technology
Variance Estimator
Power Supply
Room Temperature
Top Venues
ESSCIRC
IET Circuits Devices Syst.
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Publications
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Kan Takeuchi
,
Masaki Shimada
,
Takeshi Okagaki
,
Koji Shibutani
,
Koji Nii
,
Fumio Tsuchiya
Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators.
IET Circuits Devices Syst.
12 (2) (2018)
Kan Takeuchi
,
Masaki Shimada
,
Takeshi Okagaki
,
Koji Shibutani
,
Koji Nii
,
Fumio Tsuchiya
FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs.
ESSCIRC
(2016)
Mitsuhiko Igarashi
,
Kan Takeuchi
,
Takeshi Okagaki
,
Koji Shibutani
,
Hiroaki Matsushita
,
Koji Nii
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology.
ESSCIRC
(2015)