FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs.
Kan TakeuchiMasaki ShimadaTakeshi OkagakiKoji ShibutaniKoji NiiFumio TsuchiyaPublished in: ESSCIRC (2016)
Keyphrases
- electric field
- room temperature
- power system
- metal oxide
- duty cycle
- electrical power
- least squares
- transmission line
- variance estimator
- dielectric constant
- power supply
- steady state
- phase difference
- high voltage
- maximum likelihood
- neural network
- low frequency
- communication systems
- maximum a posteriori
- space charge
- low cost