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An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology.
Mitsuhiko Igarashi
Kan Takeuchi
Takeshi Okagaki
Koji Shibutani
Hiroaki Matsushita
Koji Nii
Published in:
ESSCIRC (2015)
Keyphrases
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cmos technology
mixed signal
low power
spl times
power consumption
human computer interaction
low voltage
parallel processing
cmos image sensor
low cost
silicon on insulator
power dissipation
high speed
image sensor
digital camera
embedded dram
pattern recognition