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A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process.

Genichi TanakaKan TakeuchiMinoru ItoHiroaki Matsushita
Published in: CICC (2008)
Keyphrases
  • hidden markov models
  • databases
  • social networks
  • real time
  • genetic algorithm
  • image sequences
  • multi agent
  • expert systems
  • process model