An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM.
Mitsuhiko IgarashiYuuki UchidaYoshio TakazawaMakoto YabuuchiYasumasa TsukamotoKoji ShibutaniKazutoshi KobayashiPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2021)