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Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET.
Mitsuhiko Igarashi
Yuuki Uchida
Yoshio Takazawa
Yasumasa Tsukamoto
Koji Shibutani
Koji Nii
Published in:
IRPS (2018)
Keyphrases
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positive effects
negative impact
neural network
interaction effects
machine learning
factors that influence
databases
social networks
information systems
decision trees
image sequences
multi agent
statistical analysis
negative effects
perceived risk