Ryo Mori

Publication Activity (10 Years)

Years Active: 2007-2016
Publications (10 Years): 2

Top Topics

Level Parallelism

Vlsi Architecture

Top Venues

IEEE J. Emerg. Sel. Topics Circuits Syst.

Publications

Takao Nomura, Ryo Mori, Koji Takayanagi, Kazuki Fukuoka, Koji Nii
Design Challenges in 3-D SoC Stacked With a 12.8 GB/s TSV Wide I/O DRAM. IEEE J. Emerg. Sel. Topics Circuits Syst. 6 (3) (2016)
Mitsuhiko Igarashi, Toshifumi Uemura, Ryo Mori, Hiroshi Kishibe, Midori Nagayama, Masaaki Taniguchi, Kohei Wakahara, Toshiharu Saito, Masaki Fujigaya, Kazuki Fukuoka, Koji Nii, Takeshi Kataoka, Toshihiro Hattori
A 28 nm High-k/MG Heterogeneous Multi-Core Mobile Application Processor With 2 GHz Cores and Low-Power 1 GHz Cores. IEEE J. Solid State Circuits 50 (1) (2015)
Mitsuhiko Igarashi, Toshifumi Uemura, Ryo Mori, Noriaki Maeda, Hiroshi Kishibe, Midori Nagayama, Masaaki Taniguchi, Kohei Wakahara, Toshiharu Saito, Masaki Fujigaya, Kazuki Fukuoka, Koji Nii, Takeshi Kataoka, Toshihiro Hattori
10.2 A 28nm HPM heterogeneous multi-core mobile application processor with 2GHz cores and low-power 1GHz cores. ISSCC (2014)
Kentaro Mori, Yoshihiro Ono, Shinji Watanabe, Toshikazu Ishikawa, Michiaki Sugiyama, Satoshi Imasu, Toshihiko Ochiai, Ryo Mori, Tsuyoshi Kida, Tomoaki Hashimoto, Hideki Tanaka, Michitaka Kimura
High density and reliable packaging technology with Non Conductive Film for 3D/TSV. 3DIC (2013)
Takao Nomura, Ryo Mori, Munehiro Ito, Koji Takayanagi, Toshihiko Ochiai, Kazuki Fukuoka, Kazuo Otsuga, Koji Nii, Sadayuki Morita, Tomoaki Hashimoto, Tsuyoshi Kida, Junichi Yamada, Hideki Tanaka
Testability improvement for 12.8 GB/s Wide IO DRAM controller by small area pre-bonding TSV tests and a 1 GHz sampled fully digital noise monitor. CICC (2013)
Kazuki Fukuoka, Ryo Mori, A. Kato, Motoshige Igarashi, Koji Shibutani, T. Yamaki, Shinji Tanaka, Koji Nii, Sadayuki Morita, Takao Koike, Noriaki Sakamoto
A 123μW standby power technique with EM-tolerant 1.8V I/O NMOS power switch in 28nm HKMG technology. CICC (2012)
Yusuke Kanno, Yuki Kondoh, Takahiro Irita, Kenji Hirose, Ryo Mori, Yoshihiko Yasu, Shigenobu Komatsu, Hiroyuki Mizuno
In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution. IEEE J. Solid State Circuits 42 (4) (2007)