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In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution.

Yusuke KannoYuki KondohTakahiro IritaKenji HiroseRyo MoriYoshihiko YasuShigenobu KomatsuHiroyuki Mizuno
Published in: IEEE J. Solid State Circuits (2007)
Keyphrases
  • prediction accuracy
  • high accuracy
  • computational efficiency
  • measurement error
  • computational cost
  • noise level
  • additive noise