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A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process.

Mitsuhiko IgarashiYuuki UchidaYoshio TakazawaYasumasa TsukamotoKoji ShibutaniKoji Nii
Published in: A-SSCC (2018)
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