Elie Maricau

Publication Activity (10 Years)

Years Active: 2008-2013
Publications (10 Years): 0

Top Topics

Regression Methods

Analog Circuits

Reliability Analysis

Active Learning

Top Venues

Publications

Georges G. E. Gielen, Elie Maricau
Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS. DATE (2013)
Elie Maricau, Dimitri de Jonghe, Georges G. E. Gielen
Hierarchical analog circuit reliability analysis using multivariate nonlinear regression and active learning sample selection. DATE (2012)
Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen
Offset measurement method for accurate characterization of BTI-induced degradation in opamps. ICECS (2012)
Georges G. E. Gielen, Elie Maricau, Pieter De Wit
Designing reliable analog circuits in an unreliable world. CICC (2012)
Dimitri de Jonghe, Elie Maricau, Georges G. E. Gielen, Trent McConaghy, Bratislav Tasic, Haralampos-G. D. Stratigopoulos
Advances in variation-aware modeling, verification, and testing of analog ICs. DATE (2012)
Elie Maricau, Georges G. E. Gielen
Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS. IEEE J. Emerg. Sel. Topics Circuits Syst. 1 (1) (2011)
Elie Maricau, Georges G. E. Gielen
Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines. ESSCIRC (2011)
Elie Maricau, Georges G. E. Gielen
Stochastic circuit reliability analysis. DATE (2011)
Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen
Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. ICECS (2011)
Georges G. E. Gielen, Elie Maricau, Pieter De Wit
Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation. DATE (2011)
Elie Maricau, Georges G. E. Gielen
Variability-aware reliability simulation of mixed-signal ICs with quasi-linear complexity. DATE (2010)
Elie Maricau, Georges G. E. Gielen
Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (12) (2010)
Georges G. E. Gielen, Elie Maricau, Pieter De Wit
Design automation towards reliable analog integrated circuits. ICCAD (2010)
Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Christos A. Papachristou
Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. IOLTS (2009)
Elie Maricau, Georges G. E. Gielen
Efficient reliability simulation of analog ICs including variability and time-varying stress. DATE (2009)
Elie Maricau, Georges G. E. Gielen
A methodology for measuring transistor ageing effects towards accurate reliability simulation. IOLTS (2009)
Elie Maricau, Pieter De Wit, Georges G. E. Gielen
An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications. Microelectron. Reliab. 48 (8-9) (2008)
Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE (2008)