Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS.
Georges G. E. GielenElie MaricauPublished in: DATE (2013)
Keyphrases
- integrated circuit
- analog vlsi
- discrete event simulation
- stochastic models
- stochastic systems
- electron beam
- circuit design
- metal oxide semiconductor
- colored petri nets
- agent based modeling
- high speed
- simulation model
- low cost
- cmos image sensor
- discrete event
- mathematical models
- stochastic simulation
- mathematical model
- neural network