Offset measurement method for accurate characterization of BTI-induced degradation in opamps.
Swaraj MahatoPieter De WitElie MaricauGeorges G. E. GielenPublished in: ICECS (2012)
Keyphrases
- high precision
- computationally efficient
- preprocessing
- objective function
- high accuracy
- significant improvement
- highly accurate
- theoretical analysis
- error rate
- experimental evaluation
- computational cost
- synthetic data
- clustering method
- dynamic programming
- prior knowledge
- completely automatic
- classification method
- detection method
- machine learning
- support vector machine svm
- em algorithm
- cost function
- artificial neural networks
- reinforcement learning
- feature extraction
- face recognition