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An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications.
Elie Maricau
Pieter De Wit
Georges G. E. Gielen
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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analytical model
simulation model
analog vlsi
analytical models
integrated circuit
low cost
signal processing
mathematical model
power consumption
circuit design