Login / Signup

Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis.

Elie MaricauGeorges G. E. Gielen
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
  • reliability analysis
  • high speed
  • artificial intelligence
  • expert systems
  • artificial neural networks