Login / Signup

Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS.

Simon Vanden BusschePieter De WitElie MaricauGeorges G. E. Gielen
Published in: ICECS (2011)
Keyphrases
  • impact analysis
  • high speed
  • low power
  • dependency analysis
  • metal oxide semiconductor
  • low voltage
  • data sets
  • machine learning
  • low cost
  • knowledge management
  • source code
  • leakage current