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Advances in variation-aware modeling, verification, and testing of analog ICs.
Dimitri de Jonghe
Elie Maricau
Georges G. E. Gielen
Trent McConaghy
Bratislav Tasic
Haralampos-G. D. Stratigopoulos
Published in:
DATE (2012)
Keyphrases
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artificial intelligence
information systems
image processing
formal verification
test generation
database
learning algorithm
bayesian networks
multiscale
test cases
symbolic execution