Low cost at-speed testing using On-Product Clock Generation compatible with test compression.
Brion L. KellerKrishna ChakravadhanulaBrian FoutzVivek ChickermaneR. MalneediThomas J. SnethenVikram IyengarDavid E. LackeyGary GrisePublished in: ITC (2010)
Keyphrases
- low cost
- high speed
- test cases
- software testing
- test generation
- real time
- statistical tests
- test data
- test sequences
- low power
- regression testing
- compression algorithm
- testing process
- test suite
- usability testing
- test data generation
- data compression
- integration testing
- model based testing
- set of test cases
- test case generation
- code coverage
- data sets
- generation process
- embedded systems
- digital camera
- image compression
- single chip
- compression ratio
- life cycle
- number of test cases
- test driven development