Static test compaction for IDDQ testing of bridging faults in sequential circuits.
Yoshinobu HigamiKewal K. SalujaYuzo TakamatsuKozo KinoshitaPublished in: Systems and Computers in Japan (2000)
Keyphrases
- test cases
- built in self test
- test data
- test generation
- software testing
- model based testing
- test suite
- test sequences
- statistical tests
- mutation testing
- regression testing
- test case generation
- fault diagnosis
- testing process
- test data generation
- unit testing
- usability testing
- set of test cases
- quality assurance
- integration testing
- fault models
- dynamic analysis
- item response theory
- neural network
- correlation analysis
- static analysis
- model based diagnosis
- integrated circuit
- test set
- training data
- machine learning