WIDE ANGLE
Experts
- Sota Shimizu
- Tomás Pajdla
- Shigang Li
- Zuzana Kukelova
- Bin Fan
- Joel W. Burdick
- Nobuyuki Hasebe
- Olivier Morel
- Shan Zhao
- Kun Wang
- Shuaicheng Liu
- Shang-Hong Lai
- Wageeh W. Boles
- Peter Hansen
- Nobuyuki Kita
- Yuchao Dai
- Bin Xu
- Peter Corke
- Daniel Pohl
- Peter G. Boyvalenkov
- Fei Wu
- Peter F. Sturm
- Hossien B. Eldeeb
- Shree K. Nayar
- Irfan A. Essa
- Yang Liu
- Jean-Marc Lavest
- Douglas Lanman
- K. L. Bhanu Moorthy
- Chia-Kai Liang
- Hua Yan
- Yasuyo Kita
- Ichiro Sakuma
- Altino F. Santos
- Jean-François Lalonde
- Wataru Chujo
- Tung-Ying Lee
- Zvi S. Roth
- Luc Van Gool
Venues
- CoRR
- Sensors
- IEEE Access
- IROS
- ICRA
- CVPR
- IEEE Trans. Instrum. Meas.
- ICCV
- Remote. Sens.
- ICIP
- VR
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ROBIO
- CHI
- ICPR
- ICASSP
- ACC
- OFC
- IEEE Robotics Autom. Lett.
- J. Robotics Mechatronics
- IECON
- IEEE Trans. Inf. Theory
- CVPR Workshops
- Comput. Vis. Image Underst.
- IEEE Trans. Veh. Technol.
- ACM Trans. Graph.
- ACCV (1)
- ICCV Workshops
- IEEE Trans. Robotics
- J. Electronic Imaging
- Multim. Tools Appl.
- ITSC
- IEEE Trans. Aerosp. Electron. Syst.
- WACV
- Mach. Vis. Appl.
- Pattern Recognit. Lett.
- IEEE Trans. Intell. Transp. Syst.
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