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Experts
- Shuaicheng Liu
- Hideo Saito
- Nianjin Ye
- Torsten Sattler
- Yijia He
- Guoquan Huang
- In-So Kweon
- Neil Lutz
- Daniel Barath
- Nassir Navab
- Yosi Keller
- Chuan Wang
- Wan-Chi Siu
- Anna-Lena Trautmann
- Chunyu Lin
- Sudipta N. Sinha
- Yeeun Kim
- James F. Blinn
- Yoli Shavit
- Haruto Hirosawa
- Jirong Zhang
- Andrey Ignatov
- Pascal Fua
- Hai Jiang
- Hyunjun Lim
- Radu Timofte
- Hyun Myung
- Adrien Bartoli
- Haijiang Zhu
- Joachim Rosenthal
- Tien Do
- Yong Liu
- Robert E. Mahony
- Olivier D. Faugeras
- Frank C. D. Tsai
- Yuhang Lu
- Jue Wang
- Xingxing Zuo
- Atsushi Yamashita
Venues
- CoRR
- IEEE Access
- CVPR
- Sensors
- ICRA
- IROS
- ICCV
- Remote. Sens.
- IEEE Robotics Autom. Lett.
- ICIP
- SIROCCO
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- Pattern Recognit. Lett.
- IEEE Trans. Instrum. Meas.
- AAAI
- Discret. Comput. Geom.
- 3DV
- Neurocomputing
- ICME
- BMVC
- ICASSP
- J. Electronic Imaging
- ACM Multimedia
- ISPRS Int. J. Geo Inf.
- MVA
- Trans. GIS
- Comput. Vis. Image Underst.
- WACV
- 3DPVT
- Multim. Tools Appl.
- ITSC
- Image Vis. Comput.
- CVPR (1)
- IEEE Computer Graphics and Applications
- Eng. Appl. Artif. Intell.
- ECCV (1)
- CDC
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