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Experts
- Shuaicheng Liu
- Hideo Saito
- Torsten Sattler
- Yijia He
- Nianjin Ye
- Wan-Chi Siu
- Guoquan Huang
- Yosi Keller
- In-So Kweon
- Daniel Barath
- Chunyu Lin
- Chuan Wang
- Neil Lutz
- Anna-Lena Trautmann
- Nassir Navab
- Shoudong Huang
- Jack H. Lutz
- Lanpeng Jia
- Jirong Zhang
- Radu Timofte
- Yuhang Lu
- Xingxing Zuo
- Martin Jägersand
- Joachim Rosenthal
- Yeeun Kim
- Atsushi Yamashita
- Robert E. Mahony
- Hyun Myung
- Hajime Asama
- Frank C. D. Tsai
- Yoli Shavit
- Olivier D. Faugeras
- Hyunjun Lim
- Haruto Hirosawa
- Yong Liu
- Pascal Fua
- Jue Wang
- Kwangyik Jung
- Andrey Ignatov
Venues
- CoRR
- IEEE Access
- Sensors
- CVPR
- IROS
- ICRA
- ICCV
- Remote. Sens.
- ICIP
- Pattern Recognit.
- SIROCCO
- ICPR
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Robotics Autom. Lett.
- Discret. Comput. Geom.
- Neurocomputing
- 3DV
- J. Electronic Imaging
- ACM Multimedia
- ICME
- BMVC
- ISPRS Int. J. Geo Inf.
- IEEE Trans. Instrum. Meas.
- WACV
- CVPR (1)
- 3DPVT
- Image Vis. Comput.
- MVA
- Multim. Tools Appl.
- ICASSP
- Trans. GIS
- ITSC
- IECON
- ECCV (1)
- CRV
- IEEE Computer Graphics and Applications
- ICDAR
- SII
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