Shuji Hamada

Publication Activity (10 Years)

Years Active: 1991-2006
Publications (10 Years): 0

Publications

Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara
A Statistical Quality Model for Delay Testing. IEICE Trans. Electron. (3) (2006)
Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato
A Framework of High-quality Transition Fault ATPG for Scan Circuits. ITC (2006)
Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato
A dynamic test compaction procedure for high-quality path delay testing. ASP-DAC (2006)
Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Noduyama, Yasuo Sato
Recognition of Sensitized Longest Paths in Transition Delay Test. ITC (2006)
Anis Uzzaman, Mick Tegethoff, Bibo Li, Kevin Mc Cauley, Shuji Hamada, Yasuo Sato
Not all Delay Tests Are the Same - SDQL Model Shows True-Time. ATS (2006)
Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo
Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. ATS (2006)
Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Nozuyama, Seiji Kajihara
Invisible delay quality - SDQM model lights up what could not be seen. ITC (2005)
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato
Path delay test compaction with process variation tolerance. DAC (2005)
Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara
Evaluation of the statistical delay quality model. ASP-DAC (2005)
Teruhiko Yamada, Shuji Hamada, Tatsuo Matsumoto, Toshihiko Takahashi, Takao Nakayama
Method of diagnosing multiple stuck-at-faults in combinational circuits. Systems and Computers in Japan 22 (11) (1991)