Masayasu Fukunaga

Publication Activity (10 Years)

Years Active: 2003-2008
Publications (10 Years): 0

Publications

Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo
Estimation of Delay Test Quality and Its Application to Test Generation. Inf. Media Technol. 3 (4) (2008)
Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo
Estimation of Delay Test Quality and Its Application to Test Generation. IPSJ Trans. Syst. LSI Des. Methodol. 1 (2008)
Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo
Estimation of delay test quality and its application to test generation. ICCAD (2007)
Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato
A dynamic test compaction procedure for high-quality path delay testing. ASP-DAC (2006)
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato
Path delay test compaction with process variation tolerance. DAC (2005)
Masayasu Fukunaga, Seiji Kajihara, Sadami Takeoka
On Statistical Estimation of Fault Efficiency for Path Delay Faults Based on Untestable Path Analysis. IEICE Trans. Inf. Syst. (7) (2005)
Masayasu Fukunaga, Seiji Kajihara, Sadami Takeoka
On Estimation of Fault Efficiency for Path Delay Faults. Asian Test Symposium (2003)
Masayasu Fukunaga, Seiji Kajihara, Sadami Takeoka, Shinichi Yosimura
On effective criterion of path selection for delay testing. ASP-DAC (2003)
Masayasu Fukunaga, Seiji Kajihara, Sadami Takeoka, Shinichi Yoshimura
Evaluation of Delay Testing Based on Path Selection. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2003)