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Shohei Morishima
Publication Activity (10 Years)
Years Active: 2005-2008
Publications (10 Years): 0
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Publications
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Seiji Kajihara
,
Shohei Morishima
,
Masahiro Yamamoto
,
Xiaoqing Wen
,
Masayasu Fukunaga
,
Kazumi Hatayama
,
Takashi Aikyo
Estimation of Delay Test Quality and Its Application to Test Generation.
IPSJ Trans. Syst. LSI Des. Methodol.
1 (2008)
Seiji Kajihara
,
Shohei Morishima
,
Masahiro Yamamoto
,
Xiaoqing Wen
,
Masayasu Fukunaga
,
Kazumi Hatayama
,
Takashi Aikyo
Estimation of delay test quality and its application to test generation.
ICCAD
(2007)
Seiji Kajihara
,
Shohei Morishima
,
Akane Takuma
,
Xiaoqing Wen
,
Toshiyuki Maeda
,
Shuji Hamada
,
Yasuo Sato
A Framework of High-quality Transition Fault ATPG for Scan Circuits.
ITC
(2006)
Xiaoqing Wen
,
Yoshiyuki Yamashita
,
Shohei Morishima
,
Seiji Kajihara
,
Laung-Terng Wang
,
Kewal K. Saluja
,
Kozo Kinoshita
Low-capture-power test generation for scan-based at-speed testing.
ITC
(2005)