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Low-capture-power test generation for scan-based at-speed testing.
Xiaoqing Wen
Yoshiyuki Yamashita
Shohei Morishima
Seiji Kajihara
Laung-Terng Wang
Kewal K. Saluja
Kozo Kinoshita
Published in:
ITC (2005)
Keyphrases
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test generation
test cases
symbolic execution
test sequences
software testing
mutation testing
power consumption
code coverage
design automation
static analysis
quality assurance
high speed
test data generation
regression testing
cooperative
data sets
quality control
test set
computer vision
learning algorithm