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A Framework of High-quality Transition Fault ATPG for Scan Circuits.

Seiji KajiharaShohei MorishimaAkane TakumaXiaoqing WenToshiyuki MaedaShuji HamadaYasuo Sato
Published in: ITC (2006)
Keyphrases
  • high quality
  • database
  • artificial intelligence
  • learning algorithm
  • multiscale
  • expert systems
  • high speed
  • bayesian framework
  • conceptual framework
  • fault detection