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Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.

Xijiang LinKun-Han TsaiChen WangMark KassabJanusz RajskiTakeo KobayashiRandy KlingenbergYasuo SatoShuji HamadaTakashi Aikyo
Published in: ATS (2006)
Keyphrases
  • high quality
  • real time
  • high speed
  • databases
  • ground truth
  • small number
  • test cases
  • image processing
  • image quality
  • test set
  • low quality
  • processing speed