Yasuyuki Nozuyama

Publication Activity (10 Years)

Years Active: 1988-2005
Publications (10 Years): 0

Publications

Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Nozuyama, Seiji Kajihara
Invisible delay quality - SDQM model lights up what could not be seen. ITC (2005)
Yasuyuki Nozuyama
Realization of an efficient design verification test used on a microinstruction controlled self test. ITC (1990)
Yasuyuki Nozuyama, Akira Nishimura, Jun Iwamura
Design for testability of a 32-bit TRON microprocessor. Microprocess. Microsystems 13 (1) (1989)
Yasuyuki Nozuyama, Akira Nishimura, Jun Iwamura
Implementation and Evaluation of Microinstruction-Controlled Self Test Using a Masked Microinstruction Scheme. ITC (1989)
Yasuyuki Nozuyama, Akira Nishimura, Jun Iwamura
Design for Testability of a 32-Bit Microprocessor, the TX1. ITC (1988)