Method of diagnosing multiple stuck-at-faults in combinational circuits.
Teruhiko YamadaShuji HamadaTatsuo MatsumotoToshihiko TakahashiTakao NakayamaPublished in: Systems and Computers in Japan (1991)
Keyphrases
- detection method
- high accuracy
- similarity measure
- computationally efficient
- fully automatic
- high precision
- classification method
- segmentation method
- classification accuracy
- prior knowledge
- training set
- computational complexity
- data sets
- segmentation algorithm
- clustering method
- probabilistic model
- computational cost
- optimization method