BIFEST: a built-in intermediate fault effect sensing and test generation system for CMOS bridging faults.
Kuen-Jong LeeJing-Jou TangTsung-Chu HuangPublished in: ACM Trans. Design Autom. Electr. Syst. (1999)
Keyphrases
- test generation
- test cases
- fault diagnosis
- fault detection
- mutation testing
- fault model
- multiple faults
- symbolic execution
- test sequences
- design automation
- fault detection and isolation
- software testing
- quality assurance
- static analysis
- low cost
- model based diagnosis
- high speed
- image sensor
- code coverage
- repair actions
- normal operation
- databases
- fault isolation
- test data generation
- test suite
- fault models
- power consumption
- training data
- artificial intelligence