Integrating an Electron-Beam System into VLSI Fault Diagnosis.
Teruo TamamaNorio KujiPublished in: IEEE Des. Test (1986)
Keyphrases
- fault diagnosis
- electron beam
- x ray
- neural network
- fault detection
- integrated circuit
- bp neural network
- expert systems
- design parameters
- gas turbine
- fuzzy logic
- semiconductor devices
- condition monitoring
- industrial systems
- rbf neural network
- monitoring and fault diagnosis
- multiple faults
- fault detection and diagnosis
- failure diagnosis
- multi sensor information fusion
- electronic equipment
- operating conditions
- power transformers
- analog circuits
- rotating machinery
- chemical process
- fault identification
- decision making
- design space
- electrical power systems
- genetic algorithm