Norio Kuji

Publication Activity (10 Years)

Years Active: 1985-2010
Publications (10 Years): 0

Publications

Noriharu Miyaho, Yoichi Iwaki, Tomohiro Yamazaki, Norio Kuji
Hybrid processing system for sensor networks based on an event-driven framework. IET Commun. 4 (7) (2010)
Norio Kuji, Takako Ishihara
EB-Testing-Pad Method and Its Evaluation by Actual Devices. Asian Test Symposium (2001)
Norio Kuji
Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits. Asian Test Symposium (1997)
Norio Kuji, Kiyoshi Matsumoto
Marginal fault diagnosis based on e-beam static fault imaging with CAD interface. ITC (1990)
Teruo Tamama, Norio Kuji
Integrating an Electron-Beam System into VLSI Fault Diagnosis. IEEE Des. Test 3 (4) (1986)
Norio Kuji, Teruo Tamama, M. Nagatani
FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5 (2) (1986)
Norio Kuji, Teruo Tamama
An Automated F-Beam Tester with CAD Interface, "Finder": A Powerful Tool for Fault Diagnosis of ASICs. ITC (1986)
Norio Kuji, Teruo Tamama
Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. ITC (1985)
Norio Kuji, Teruo Tamama, Takao Yano
A Fully-Automated Electron Beam Test System for VLSI Circuits. IEEE Des. Test 2 (5) (1985)