FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits.
Norio KujiTeruo TamamaM. NagataniPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1986)
Keyphrases
- fault diagnosis
- vlsi circuits
- electron beam
- neural network
- x ray
- integrated circuit
- expert systems
- low power
- computer aided
- design parameters
- fault detection and diagnosis
- semiconductor devices
- bp neural network
- electronic equipment
- fuzzy logic
- fault detection
- rotating machinery
- analog circuits
- rbf neural network
- operating conditions
- multiple faults
- power transformers
- gas turbine
- multi sensor information fusion
- mixed signal
- condition monitoring
- power plant
- high speed
- tennessee eastman
- monitoring and fault diagnosis
- case study
- chemical process
- power consumption
- low cost