Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit.
Norio KujiTeruo TamamaPublished in: ITC (1985)
Keyphrases
- high speed
- vlsi circuits
- cmos technology
- fault diagnostic
- black box
- semi automated
- power dissipation
- low power
- gate array
- multiple input
- single chip
- signal processing
- automated analysis
- vlsi design
- data sets
- computer aided
- computational intelligence
- analog circuits
- chip design
- electronic circuits
- processor array
- short circuit
- nano scale
- real time
- field effect transistors
- vlsi architecture
- logic circuits
- testing process
- artificial intelligence
- circuit design
- semi automatic